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HT-E2000 Ccl Laser Thinckness Measuring System
Ccl Laser Thinckness Measuring System
■ Requirements for improving the accuracy of existing products
■ For quality stability request of mass-production products, must be able to detect defects and to regress correct system immediately
■ Improvement of detection speed
■ Administration requests for data rationalization
■ Requests for measurement quality
■ Decrease of detection costs
■ Promotion of competition
■ Decrease the instability of artificial measurements
■ Reach the target of measurement automation
■ Requirements for improving the accuracy of existing products
■ For quality stability request of mass-production products, must be able to detect defects and to regress correct system immediately
■ Improvement of detection speed
■ Administration requests for data rationalization
■ Requests for measurement quality
■ Decrease of detection costs
■ Promotion of competition
■ Decrease the instability of artificial measurements
■ Reach the target of measurement automation
Specifications